Akira Inoue is a visiting scholar at US-ATMC for 2015-2016. He is currently a senior expert at Information and Media Processing Laboratories, NEC Corporation. He received his Ph.D in engineering from Tsukuba University and B.S. from Osaka University in Japan.
His main research fields are pattern recognition, computer vision, and color image processing. He has worked for NEC Corporation for many years and holds a number of patents in the research field. Currently his interest is to investigate advanced technologies and market trends in data analytics and intelligent systems. He is a member of IEEE (The Institute of Electrical and Electronics Engineers) and IEICE (The Institute of Electronics, Information and Communication Engineers).